For P700 Measurements
When leaf samples are smaller than the cross-sectional area of the measuring beam, the measuring light bypassing the leaf diminishes the P700 signal quality. To prevent the negative effects of bypassing measuring light, we offer a set of optical pinholes (DUAL-OP) to adjust the cross-sectional area of the measuring beam to the sample area.
Please note WALZ new pricing as of July 1, 2023.
- Available to end-users in the US and Canada only